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GaAs & GaN RF Technologies
InGaP HBT
High Linearity InGaP HBT
High Voltage and GSM InGaP HBT
VCO InGaP HBT
GaAs PHEMT
0.5um D-Mode T-Gate PHEMT
0.5um Switch PHEMT
0.5um E/D-mode PHEMT
0.25um D-Mode T-Gate PHEMT Power Process
HFET
GaN HEMT
Integrated Passive Devices
THz Schottky Diode
InP HBT Technologies
GaN Power Electronics Technologies
GaN Technologies
Optoelectronics Technologies
Foundry Services
GaAs & GaN RF Wafer Foundry
InP HBT Wafer Foundry
OPTOELECTRONICS Wafer Foundry
Customer Proprietary Process Manufacturing
Manufacturing Capabilities
Processing Capabilities
Testing Capabilities
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GaAs & InGaAs PIN Photodetectors & Arrays
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Pure-play Wafer Foundry
Pure-play Wafer Foundry
Technology
Foundry Services
GaAs & GaN RF Wafer Foundry
InP HBT Wafer Foundry
OPTOELECTRONICS Wafer Foundry
Customer Proprietary Process Manufacturing
Manufacturing Capabilities
Processing Capabilities
Testing Capabilities
Foundry Support
Home > Pure-play Wafer Foundry > Foundry Services > Manufacturing Capabilities > Testing Capabilities
Testing Capabilities
100% on-wafer Automated DC and RF Testing
DC (die sorting)
RF (up to 20 GHz): OIP3, harmonics, Oscillator, S-parameters, etc.
Engineering Characterization Support (Up to 40 GHz)
Device Modeling (linear and non-linear models)
DC parametric test
RF small signal/large signal characterizations (load pull, OIP3, noise parameters etc.)
Automatic Wafer Mapping With Ink or Inkless Electronic Wafer Mapping
